Testing and design for testability techniques for quantum reversible circuits

dc.contributor.guide	Das, Debesh Kumar
dc.coverage.spatial
dc.creator.researcher	Mondal, Joyati
dc.date.accessioned	2023-03-24T06:40:33Z
dc.date.available	2023-03-24T06:40:33Z
dc.date.awarded	2022
dc.date.completed	2021
dc.date.registered
dc.description.abstract	newline
dc.description.note
dc.format.accompanyingmaterial	None
dc.format.dimensions
dc.format.extent	[xx], 123 p.
dc.identifier.uri	http://hdl.handle.net/10603/472075
dc.language	English
dc.publisher.institution	Department of Computer Science and Engineering
dc.publisher.place	Kolkata
dc.publisher.university	Jadavpur University
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Circuit Testing
dc.subject.keyword	Missing gate fault
dc.subject.keyword	Reversible computing
dc.title	Testing and design for testability techniques for quantum reversible circuits
dc.title.alternative
dc.type.degree	Ph.D.