Testing and design for testability techniques for quantum reversible circuits

Files

01_title.pdf (66.4 KB)

02_prelim pages.pdf (190.94 KB)

03_chapter 1.pdf (126.2 KB)

04_chapter 2.pdf (463.96 KB)

05_chapter 3.pdf (251.36 KB)

Abstract

newline

URI

http://hdl.handle.net/10603/472075

Collections

Department of Computer Science and Engineering