Investigations on Low Power Design for Testability Architectures for System on Chip Platforms using Dynamic Scan

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01. first page.pdf (220.46 KB)
 02. declaration.pdf (273.54 KB)
 03. bonafide certificate.pdf (275.17 KB)
 04. abstract.pdf (183.86 KB)
 05. acknowledgement.pdf (177.52 KB)

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http://hdl.handle.net/10603/315620

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Department of Electronics and Communication Engineering

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