Scanning probe microscopic studies of swift heavy ion irradiated semiconducting and semi-metallic surfaces

dc.contributor.guideKanjilal, D.en_US
dc.coverage.spatialNuclear Scienceen_US
dc.creator.researcherSingh, Jitendra Pratapen_US
dc.date.accessioned2014-01-27T08:06:46Z
dc.date.available2014-01-27T08:06:46Z
dc.date.awardedn.d.en_US
dc.date.completed2001en_US
dc.date.issued2014-01-27
dc.date.registeredn.d.en_US
dc.description.abstractNoneen_US
dc.description.noteBibliography p.181-187en_US
dc.format.accompanyingmaterialNoneen_US
dc.format.dimensions-en_US
dc.format.extent187p.en_US
dc.identifier.urihttp://hdl.handle.net/10603/15456
dc.languageEnglishen_US
dc.publisher.institutionNuclear Science Centreen_US
dc.publisher.placeDelhien_US
dc.publisher.universityJawaharlal Nehru Universityen_US
dc.relation-en_US
dc.rightsuniversityen_US
dc.source.inflibnetINFLIBNETen_US
dc.subject.keywordNuclear Scienceen_US
dc.subject.keywordsemi-metallic surfacesen_US
dc.subject.keywordScanning probeen_US
dc.subject.keywordswift heavy ionen_US
dc.subject.keywordsemiconductingen_US
dc.titleScanning probe microscopic studies of swift heavy ion irradiated semiconducting and semi-metallic surfacesen_US
dc.title.alternative-en_US
dc.type.degreePh.D.en_US

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