Random variability study in advanced CMOS devices

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dc.contributor.guideMallik, Abhijit
dc.coverage.spatial
dc.creator.researcherNawaz, Masum
dc.date.accessioned2019-06-03T07:11:06Z
dc.date.available2019-06-03T07:11:06Z
dc.date.awarded
dc.date.completed2017
dc.date.registered
dc.description.abstractAbstract available
dc.description.note
dc.description.provenanceMade available in DSpace on 2019-06-03T07:11:06Z (GMT). No. of bitstreams: 14 01_title page.pdf: 181496 bytes, checksum: 007593b60be9873edc77eecdb2996094 (MD5) 02_abstract.pdf: 560599 bytes, checksum: 296ffa88d9744a6231ac4f4b59dc1173 (MD5) 03_acknowledgemnt.pdf: 103377 bytes, checksum: 75c651a00a7497f041513242c5b219de (MD5) 04_list of publication.pdf: 240152 bytes, checksum: d7fde869ee9a76555eb2f7b2e2c3ee53 (MD5) 05_content.pdf: 183868 bytes, checksum: 5a2720457ae721817809a3a1791632d2 (MD5) 06_chapter 1.pdf: 384479 bytes, checksum: e5953d47e6bdff98b0c70e34d92082a9 (MD5) 07_chapter 2.pdf: 1379979 bytes, checksum: d361bc8f780afebd2bfbb581d44ca277 (MD5) 08_chapter 3.pdf: 419900 bytes, checksum: 3e3496e85045455b427b12b590bb528a (MD5) 09_chapter 4.pdf: 736658 bytes, checksum: 3a0b52b743653b035e456c351ebebc32 (MD5) 10_chapter 5.pdf: 567056 bytes, checksum: fc4f74e0a50f516bae54c9a374d22824 (MD5) 11_chapter 6.pdf: 431142 bytes, checksum: 02100f7b996db5fabe253d92eadafdce (MD5) 12_chapter 7.pdf: 409511 bytes, checksum: 5ebade7e8603819e60d4c15de66d98af (MD5) 13_chapter 8.pdf: 358892 bytes, checksum: 080d6a6e6b1299710d1017abb32487ef (MD5) license.txt: 1837 bytes, checksum: ebde26e9c598048970cb6f8173ba5cb2 (MD5)en
dc.format.accompanyingmaterialDVD
dc.format.dimensions
dc.format.extentviii, 143p
dc.identifier.urihttp://hdl.handle.net/10603/245396
dc.languageEnglish
dc.publisher.institutionDepartment of Electronic Science
dc.publisher.placeKolkata
dc.publisher.universityUniversity of Calcutta
dc.relation134 - 138
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordElectronic
dc.subject.keywordEngineering and Technology,Engineering,Engineering Electrical and Electronic
dc.subject.keywordMosfet
dc.subject.keywordScaling
dc.subject.keywordScience
dc.titleRandom variability study in advanced CMOS devices
dc.title.alternative
dc.type.degreePh.D.

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