Study of structural and optical properties of Ga Ge TE and bise thin films and their crytallization behaviour on laser and thermal annealing

dc.contributor.guide	Malhotra, L.K. and Reddy, G.B.
dc.coverage.spatial	Department of Physics
dc.creator.researcher	Sripathi, Y.
dc.date.accessioned	2025-01-02T10:32:41Z
dc.date.available	2025-01-02T10:32:41Z
dc.date.awarded	1993
dc.date.completed	1993
dc.date.registered
dc.description.abstract	Abstract Available
dc.description.note	NA
dc.format.accompanyingmaterial	DVD
dc.format.dimensions	NA
dc.format.extent	NA
dc.identifier.uri	http://hdl.handle.net/10603/611070
dc.language	English
dc.publisher.institution	Department of Physics
dc.publisher.place	Delhi
dc.publisher.university	Indian Institute of Technology Delhi
dc.relation	TH2112
dc.rights	university
dc.source.university	University
dc.subject.keyword	Physical Sciences
dc.subject.keyword	Physics
dc.subject.keyword	Physics Applied
dc.title	Study of structural and optical properties of Ga Ge TE and bise thin films and their crytallization behaviour on laser and thermal annealing
dc.title.alternative	NA
dc.type.degree	Ph.D.