Design and Reliability Improvement of Tunnel Field Effect Transistor

dc.contributor.guide	Singh, Sajai Vir and Nigam, Kaushal
dc.creator.researcher	Kwatra, Priyanka
dc.date.accessioned	2023-10-10T11:34:14Z
dc.date.available	2023-10-10T11:34:14Z
dc.date.awarded	2023
dc.date.completed	2023
dc.date.registered	2018
dc.description.abstract	Available
dc.format.accompanyingmaterial	None
dc.format.extent	xxxi, 189p., Synopsis-16
dc.identifier.uri	http://hdl.handle.net/10603/517218
dc.language	English
dc.publisher.institution	Department of Electronics and Communication Engineering
dc.publisher.place	Noida
dc.publisher.university	Jaypee Institute of Information Technology
dc.rights	University
dc.source.university	University
dc.subject.keyword	Analogue/RF and linearity FOMs
dc.subject.keyword	Band-to-band tunnelling
dc.subject.keyword	Bilateral tunnelling based TFET
dc.subject.keyword	CMOS scaling
dc.subject.keyword	Dual gate oxide
dc.subject.keyword	Engineering
dc.subject.keyword	Engineering and Technology
dc.subject.keyword	Engineering Electrical and Electronic
dc.subject.keyword	Interface trap charges
dc.subject.keyword	Tunnel field effect transistor.
dc.title	Design and Reliability Improvement of Tunnel Field Effect Transistor
dc.type.degree	Ph.D.