ANALYSIS OF SULPHUR DEFICIENCY DEFECT PREVALENT IN SILAR DEPOSITED CdS BASED THIN FILMS AND ITS RECTIFICATION BY EMPLOYING AN IMPROVED SILAR TECHNIQUE

dc.contributor.guide	RAVICHANDRAN, K.
dc.coverage.spatial
dc.creator.researcher	NISHA BANU, N.
dc.date.accessioned	2018-07-23T09:01:26Z
dc.date.available	2018-07-23T09:01:26Z
dc.date.awarded	2017
dc.date.completed	2016
dc.date.registered	10-10-2012
dc.description.abstract	newline
dc.description.note
dc.format.accompanyingmaterial	DVD
dc.format.dimensions
dc.format.extent
dc.identifier.uri	http://hdl.handle.net/10603/209170
dc.language	English
dc.publisher.institution	Department of Physics
dc.publisher.place	Tiruchirappalli
dc.publisher.university	Bharathidasan University
dc.relation
dc.rights	university
dc.source.university	University
dc.title	ANALYSIS OF SULPHUR DEFICIENCY DEFECT PREVALENT IN SILAR DEPOSITED CdS BASED THIN FILMS AND ITS RECTIFICATION BY EMPLOYING AN IMPROVED SILAR TECHNIQUE
dc.title.alternative
dc.type.degree	Ph.D.