Modeling of subthreshold characteristics of short channel conventional pocket implanted and dual material gate MOSFETs

dc.contributor.guideSarkar, C.K. and Mallik, A.
dc.coverage.spatial
dc.creator.researcherBaishya, Srimanta
dc.date.accessioned2017-11-13T09:27:31Z
dc.date.available2017-11-13T09:27:31Z
dc.date.awarded2007
dc.date.completed2007
dc.date.registeredn.d.
dc.description.abstractNone newline
dc.description.noteReferences p. 131-132
dc.format.accompanyingmaterialNone
dc.format.dimensions
dc.format.extent134 p.
dc.identifier.urihttp://hdl.handle.net/10603/180641
dc.languageEnglish
dc.publisher.institutionDepartment of Electronics and Tele-Communication Engineering
dc.publisher.placeKolkata
dc.publisher.universityJadavpur University
dc.relation
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordMetal Oxide Semiconductor Field-Effect Transistor (MOSFET)
dc.subject.keywordMetal Oxide Semiconductors (MOS)
dc.subject.keywordSemiconductor devices
dc.subject.keywordShort channel MOS
dc.titleModeling of subthreshold characteristics of short channel conventional pocket implanted and dual material gate MOSFETs
dc.title.alternative
dc.type.degreePh.D.

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