Impact of see on cascoded low noise amplifier performance

Abstract

The proposed thesis Impact of SEE on Cascoded Low Noise Amplifier Performance investigates the impact of Single Event Effect SEE on the performance of cascoded Low Noise Amplifier LNA using numerical device simulations. SEE effect on electronic circuits can be categorized into i Impact of SEE on digital circuits ii Impact of SEE on RF analog circuits and iii Impact of SEE on mixed signal circuits The first category is widely studied in the literature in the name of single event upset in SRAM memory cells The second and third categories are yet to be explored Among the analog RF topologies LNA is the bottleneck in deciding the overall performance of a receiver The focus of thesis is to study the effect SEE on LNA performance High speed communication in Silicon is made possible by continuous down scaling technology Since the MOSFET at lower dimensions face the short channel effects LNA designs using novel devices are inevitable The thesis considers the following devices for the LNA design i Conventional MOSFET devices planar device built on a bulk substrate uses surface conduction ii Junctionless device planar device built on a bulk substrate uses bulk conduction and iii FinFET device newline