Automated short circuit multiple Condition coverage test case Generation

dc.contributor.guide	Godboley, Sangharatna
dc.coverage.spatial
dc.creator.researcher	Monika Rani, Golla
dc.date.accessioned	2026-01-22T08:50:16Z
dc.date.available	2026-01-22T08:50:16Z
dc.date.awarded	2025
dc.date.completed	2025
dc.date.registered	2021
dc.description.abstract	Attached newline
dc.description.note
dc.format.accompanyingmaterial	None
dc.format.dimensions
dc.format.extent	xxi, 196p.
dc.identifier.researcherid	0000-0002-1662-5764
dc.identifier.uri	http://hdl.handle.net/10603/689247
dc.language	English
dc.publisher.institution	Department of Computer Science and Engineering
dc.publisher.place	Warangal
dc.publisher.university	National Institute of Technology Warangal
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Bounded Model Checking
dc.subject.keyword	Computer Science
dc.subject.keyword	Computer Science Software Engineering
dc.subject.keyword	Coverage Guided Fuzzing
dc.subject.keyword	Dynamic Symbolic Execution
dc.subject.keyword	Engineering and Technology
dc.subject.keyword	Modified Condition/Decision Coverage
dc.subject.keyword	Multiple Condition Coverage
dc.subject.keyword	Mutation Analysis
dc.subject.keyword	Short-Circuit Multiple Condition Coverage
dc.title	Automated short circuit multiple Condition coverage test case Generation
dc.title.alternative	Automated short-circuit multiple Condition coverage test case Generation
dc.type.degree	Ph.D.