Analysis of average and local structure and charcterization of important metals and semiconductor materials using single crystal and powder x ray diffraction

dc.contributor.guide	Saravanan, R
dc.coverage.spatial	Physics
dc.creator.researcher	Prema Rani, M
dc.date.accessioned	2017-02-21T05:58:40Z
dc.date.available	2017-02-21T05:58:40Z
dc.date.awarded	n.d.
dc.date.completed	n.d.
dc.date.registered	n.d.
dc.description.abstract	None newline
dc.description.note	References Given
dc.format.accompanyingmaterial	None
dc.format.dimensions	-
dc.format.extent	333 p.
dc.identifier.uri	http://hdl.handle.net/10603/136447
dc.language	English
dc.publisher.institution	Department of Physics
dc.publisher.place	Madurai
dc.publisher.university	Madurai Kamraj University
dc.relation	-
dc.rights	university
dc.source.inflibnet	INFLIBNET
dc.subject.keyword	Crystal
dc.subject.keyword	Metallurgy
dc.subject.keyword	Metals
dc.subject.keyword	Semiconductors
dc.title	Analysis of average and local structure and charcterization of important metals and semiconductor materials using single crystal and powder x ray diffraction
dc.title.alternative	-
dc.type.degree	Ph.D.