Signal Integrity Analysis of On Chip Interconnects Using MRTD

dc.contributor.guide	Rao, N. Bheema
dc.coverage.spatial
dc.creator.researcher	Shashank, Rebelli
dc.date.accessioned	2022-01-25T10:23:41Z
dc.date.available	2022-01-25T10:23:41Z
dc.date.awarded
dc.date.completed	2019
dc.date.registered
dc.description.abstract	File Attached
dc.description.note
dc.format.accompanyingmaterial	None
dc.format.dimensions
dc.format.extent	xvii, 100 p.
dc.identifier.uri	http://hdl.handle.net/10603/358079
dc.language	English
dc.publisher.institution	Department of Electronics and Communication Engineering
dc.publisher.place	Warangal
dc.publisher.university	National Institute of Technology (NIT), Warangal
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Engineering and Technology
dc.subject.keyword	Finite difference time domain
dc.subject.keyword	Multiresolution time domain
dc.subject.keyword	Mutually coupled interconnects
dc.subject.keyword	VLSI interconnects
dc.title	Signal Integrity Analysis of On Chip Interconnects Using MRTD
dc.title.alternative	Signal Integrity Analysis of On-Chip Interconnects Using MRTD
dc.type.degree	Ph.D.