Neighborhood Pattern Sensitive Fault Detection Techniques In ram Using Built in self Test

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dc.contributor.guideAsha Rani M
dc.coverage.spatial
dc.creator.researcherRamana Kumari K L V
dc.date.accessioned2025-01-13T08:02:01Z
dc.date.available2025-01-13T08:02:01Z
dc.date.awarded2023
dc.date.completed2023
dc.date.registered2012
dc.description.abstractAttached newline
dc.description.note
dc.format.accompanyingmaterialDVD
dc.format.dimensions
dc.format.extent184pp.
dc.identifier.researcherid
dc.identifier.urihttp://hdl.handle.net/10603/614489
dc.languageEnglish
dc.publisher.institutionDepartment of Electronics and Communication Engineering
dc.publisher.placeKukatpally
dc.publisher.universityJawaharlal Nehru Technological University, Hyderabad
dc.relation
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordDetection Techniques
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.subject.keywordFault Detection
dc.subject.keywordNighborhood Pattern
dc.subject.keywordTest Methodology
dc.titleNeighborhood Pattern Sensitive Fault Detection Techniques In ram Using Built in self Test
dc.title.alternative
dc.type.degreePh.D.

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