Development of Nondestructive Evaluation Methods for Morphological and Thermal Characterization of Nanostructured Thin Films

dc.contributor.guide	Sankararaman, S
dc.coverage.spatial
dc.creator.researcher	Soumya, S
dc.date.accessioned	2023-02-09T11:38:16Z
dc.date.available	2023-02-09T11:38:16Z
dc.date.awarded	2022
dc.date.completed	2021
dc.date.registered
dc.description.abstract	newline
dc.description.note
dc.format.accompanyingmaterial	DVD
dc.format.dimensions
dc.format.extent
dc.identifier.uri	http://hdl.handle.net/10603/457652
dc.language	English
dc.publisher.institution	Department of Optoelectronics
dc.publisher.place	Thiruvananthapuram
dc.publisher.university	University of Kerala
dc.relation
dc.rights	university
dc.source.university	University
dc.subject.keyword	Nondestructive Evaluation Methods
dc.subject.keyword	Optoelectronics
dc.subject.keyword	Physical Sciences
dc.title	Development of Nondestructive Evaluation Methods for Morphological and Thermal Characterization of Nanostructured Thin Films
dc.title.alternative
dc.type.degree	Ph.D.