Defect analysis of semiconductor thin films for photovoltaic applications using photo-luminescence and photo-conductivity

dc.contributor.guideVijayakumar, K Pen_US
dc.coverage.spatialPhysicsen_US
dc.creator.researcherJayakrishnan, Ren_US
dc.date.accessioned2011-11-21T06:41:55Z
dc.date.available2011-11-21T06:41:55Z
dc.date.awarded23/04/2008en_US
dc.date.completed23/04/2008en_US
dc.date.issued2011-11-21
dc.date.registered0en_US
dc.description.noteSummary p. 235-238, Future outlook p. 239, References p. 240en_US
dc.format.accompanyingmaterialNoneen_US
dc.format.extentix, 240p.en_US
dc.identifier.urihttp://hdl.handle.net/10603/3316
dc.languageEnglishen_US
dc.publisher.institutionDept. of Physicsen_US
dc.publisher.placeCochinen_US
dc.publisher.universityCochin University of Science and Technologyen_US
dc.rightsuniversityen_US
dc.source.inflibnetINFLIBNETen_US
dc.subject.keywordPhysicsen_US
dc.subject.keywordPhoto-conductivityen_US
dc.subject.keywordPhoto-luminescenceen_US
dc.subject.keywordSemiconductoren_US
dc.subject.keywordThin filmsen_US
dc.titleDefect analysis of semiconductor thin films for photovoltaic applications using photo-luminescence and photo-conductivityen_US
dc.type.degreePh.D.en_US

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