Preparation and characterization of nanostructured pure and doped ZnO thin films for device applications by SOL_gEL method

dc.contributor.guideDeepa, M
dc.coverage.spatialPhysics
dc.creator.researcherSanthosh, V S
dc.date.accessioned2022-07-20T11:54:28Z
dc.date.available2022-07-20T11:54:28Z
dc.date.awardedn.d.
dc.date.completed2015
dc.date.registeredn.d.
dc.description.abstractAbstract not available newline newline
dc.description.noteBibliography given
dc.format.accompanyingmaterialNone
dc.format.dimensions
dc.format.extenti-xxiii, 162p.
dc.identifier.urihttp://hdl.handle.net/10603/393956
dc.languageEnglish
dc.publisher.institutionDepartment of Physics
dc.publisher.placeThiruvananthapuram
dc.publisher.universityUniversity of Kerala
dc.relationNo. of references 157
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordCrystal Structure
dc.subject.keywordMicroscopy
dc.subject.keywordPhotoelectron
dc.subject.keywordPhysical Sciences
dc.subject.keywordPhysics
dc.subject.keywordPhysics Applied
dc.subject.keywordSputtering
dc.subject.keywordX-ray
dc.titlePreparation and characterization of nanostructured pure and doped ZnO thin films for device applications by SOL_gEL method
dc.title.alternative-
dc.type.degreePh.D.

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