Ultrasonic analysis of nanomaterials for engineering applications

Abstract

In the fast-changing technological world, newer materials and products are being developed very rapidly. These developments have been taken place in view of increasing demand for better quality product having high efficiency, increased service life and making it cost effective. Due to this, the material characterization is essentially required. The rapid growth in the technological domain leads to the faster progress in the field of semiconductor for improvement of their performance at various parameters such as size, integration density, speed, multifunctionality etc., which requires highquality, well characterized insulators, semiconductors, and metals. The material quality analysis and assessment of device reliability lies in the development of the accurate, non-destructive and fast material characterization techniques for the determination of critical material parameters, e.g., optical and electrical parameters, optical characteristics, mechanical parameters and elastic parameters under the static and dynamic physical conditions. newline