Dissertation on thin film optics ellipsometric determination of the optical constants of thin metallic films

dc.contributor.guideNaik,Y Gen_US
dc.coverage.spatialData not availableen_US
dc.creator.researcherVamdatt,A Ren_US
dc.date.accessioned2015-09-02T12:34:46Z
dc.date.available2015-09-02T12:34:46Z
dc.date.awardedn.d.en_US
dc.date.completed31/12/1968en_US
dc.date.issued2015-09-02
dc.date.registeredn.d.en_US
dc.description.abstractAbstract Not Availableen_US
dc.description.noteData not availableen_US
dc.format.accompanyingmaterialNoneen_US
dc.format.dimensionsData not availableen_US
dc.format.extentxi,130p.en_US
dc.identifier.urihttp://hdl.handle.net/10603/49019
dc.languageEnglishen_US
dc.publisher.institutionSchool of Scienceen_US
dc.publisher.placeAhmedabaden_US
dc.publisher.universityGujarat Universityen_US
dc.relation125-130en_US
dc.rightsuniversityen_US
dc.source.universityUniversityen_US
dc.subject.keywordEllipsometricen_US
dc.subject.keywordFilmen_US
dc.subject.keywordMetallicen_US
dc.subject.keywordOpticalen_US
dc.subject.keywordThinen_US
dc.titleDissertation on thin film optics ellipsometric determination of the optical constants of thin metallic filmsen_US
dc.title.alternativeen_US
dc.type.degreePh.D.en_US

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