Studies on ZrN metallisation in metal semiconductor and metal oxide semiconductor structures
| dc.contributor.guide | Reddy, V. Rajagopal | en_US |
| dc.coverage.spatial | en_US | |
| dc.creator.researcher | Bhuvaneswari, H. B. | en_US |
| dc.date.accessioned | 2015-03-13T04:39:29Z | |
| dc.date.available | 2015-03-13T04:39:29Z | |
| dc.date.awarded | en_US | |
| dc.date.completed | 2005 | en_US |
| dc.date.issued | 2015-03-13 | |
| dc.date.registered | en_US | |
| dc.description.abstract | newline | en_US |
| dc.description.note | en_US | |
| dc.format.accompanyingmaterial | None | en_US |
| dc.format.dimensions | en_US | |
| dc.format.extent | en_US | |
| dc.identifier.uri | http://hdl.handle.net/10603/37102 | |
| dc.language | English | en_US |
| dc.publisher.institution | Department of Computer Science | en_US |
| dc.publisher.place | Mysore | en_US |
| dc.publisher.university | University of Mysore | en_US |
| dc.relation | en_US | |
| dc.rights | university | en_US |
| dc.source.university | University | en_US |
| dc.subject.keyword | Glow discharges | en_US |
| dc.subject.keyword | Metallizing | en_US |
| dc.subject.keyword | Microelectronics | en_US |
| dc.subject.keyword | Microprobe analysis | en_US |
| dc.subject.keyword | Scanning electron microscopy | en_US |
| dc.subject.keyword | Semiconductor-metal boundaries | en_US |
| dc.subject.keyword | Thin-film circuits | en_US |
| dc.subject.keyword | Thin films | en_US |
| dc.subject.keyword | Zirconium oxide | en_US |
| dc.title | Studies on ZrN metallisation in metal semiconductor and metal oxide semiconductor structures | en_US |
| dc.title.alternative | en_US | |
| dc.type.degree | Ph.D. | en_US |
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