Study of single event transients in CMOS timing generator and the Impact on its performance

Abstract

Timing generators are widely used in onchip clock distribution They are very critical to the performance of many clock distribution systems that impact the overall functionality of the associated integrated system The newlineoperational reliability of timing generator circuits has been a great challenge newlinein deep submicron era With further decrease in device feature sizes combined with low supply voltages and high operating frequencies the newlinereliability of timing generator circuits becomes unpredictable succumbing the newlinecircuits to noise effects such as crosstalk power supply variations and newlineradiationinduced soft errors. Soft errors or error caused by singleevent newlinestrikes disrupt the timing accuracy of the clocking system in the nuclear and newlinespace environment The study aims at designing and devising hardening newlinetechniques to mitigate singleevent transients to nearest accuracy in timing newlinegenerator for radiationhardened applications newline newline