X ray line profile analysis and its application in the microstructural studies of thin films

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dc.contributor.guideGupta, S P Sen
dc.coverage.spatialGeneral Physics and X-rays
dc.creator.researcherNandi, Ranjan Kumar
dc.date.accessioned2017-06-20T09:07:29Z
dc.date.available2017-06-20T09:07:29Z
dc.date.awardedn.d.
dc.date.completed1978
dc.date.registeredn.d.
dc.description.abstractAbstract not available
dc.description.noteData not available
dc.description.provenanceMade available in DSpace on 2017-06-20T09:07:29Z (GMT). No. of bitstreams: 14 01_title page.pdf: 21635 bytes, checksum: ebd0f7f30055a1a82518faac2d6e4c86 (MD5) 02_preface.pdf: 416031 bytes, checksum: 1f8470fe6b05b1ffe00cd3b7c6d6cbbd (MD5) 03_acknowledgement.pdf: 77947 bytes, checksum: 48567ad65e03175415f1e4cd3b5ae44c (MD5) 04_list of publication.pdf: 75512 bytes, checksum: 9fabe645c4049ce911013949d83038bc (MD5) 05_content.pdf: 104724 bytes, checksum: 61e56a070dac2db6d3ce97a48b5ef9e7 (MD5) 06_chapter 1.pdf: 815708 bytes, checksum: 3b6df10ec50c7d6dd2f1ce226c026a49 (MD5) 07_chapter 2.pdf: 2872406 bytes, checksum: 602d2b9a834eddb628dc218397ad397b (MD5) 08_chapter 3.pdf: 2850172 bytes, checksum: 751a844c105b2d2384f11ae7f3aa0f90 (MD5) 09_chapter 4.pdf: 2451504 bytes, checksum: 7a21d4e9d58465deea83c0531ac3486c (MD5) 10_chapter 5.pdf: 3275291 bytes, checksum: 8d19e94300333b56e6ec97b1e4552fff (MD5) 11_chapter 6.pdf: 1988782 bytes, checksum: 747b2154bf60de5d621add3ad3f92d3d (MD5) 12_chapter 7.pdf: 2416123 bytes, checksum: 3adbd56227b945062bcee3ec177091e9 (MD5) 13_references.pdf: 521705 bytes, checksum: 43202db074f7d7c500a8b30a18defed3 (MD5) license.txt: 1837 bytes, checksum: ebde26e9c598048970cb6f8173ba5cb2 (MD5)en
dc.format.accompanyingmaterialNone
dc.format.dimensions32cm.
dc.format.extentxv, 315p.
dc.identifier.urihttp://hdl.handle.net/10603/158153
dc.languageEnglish US
dc.publisher.institutionDepartment of General Physics and X-rays
dc.publisher.placeKolkata
dc.publisher.universityUniversity of Calcutta
dc.relation303-315
dc.rightsuniversity
dc.source.universityUniversity
dc.subject.keywordApplication
dc.subject.keywordFilms
dc.subject.keywordMicrostructural
dc.subject.keywordProfile
dc.subject.keywordSimulataneous
dc.titleX ray line profile analysis and its application in the microstructural studies of thin films
dc.title.alternative
dc.type.degreePh.D.

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